Performance benchmark of a gateable microchannel plate detector for extreme ultraviolet radiation with high temporal resolution

Bellingham, Wash / SPIE (2011) [Beitrag zu einem Tagungsband]

EUV and x-ray optics: synergy between laboratory and space : 20 - 21 April 2011, Prague, Czech Republic ; [papers presented at the SPIE Europe Conference on EUV and X-Ray Optics: Synergy between Laboratory and Space at SPIE optics + optoelectronics] / sponsored and publ. by SPIE. René Hudec ..., ed.
Seite(n): 80760R, 7 S.

Autorinnen und Autoren

Autorinnen und Autoren

Hauck, Johannes
Freiberger, Ralf
Juschkin, Larissa

Identifikationsnummern