Measuring the Cation and Oxygen Atomic Column Displacement at Picometer Precision

New York, NY / Cambridge University Press (2017) [Contribution to a conference proceedings, Journal Article]

Microscopy and microanalysis
Volume: 23
Issue: Suppl 1
Page(s): 1612-1613

Authors

Selected Authors

Wang, Yi
Jones, Lewys
Berkels, Benjamin
Sigle, Wilfried
van Aken, Peter A.

Identifier